5 mm – 10 mm Provides for short working distances and high. Press AIR button on load lock and wait for beep. Field Emission Scanning Electron Microscope.
This instruction manual describes the operation, maintenance, and specific precautions pertinent to daily operation on the model S- 4800 scanning electron microscope. Hitachi S- 4800 Scanning Electron Microscope Operating Procedure, v. Note: To log into the PC and PC- SEM software, username and password are “ semuser”. Cold Cathode Field Emission microscopy provides higher resolution, higher beam density ( brightness), and longer tip life than Thermal Tungsten wire SEMs and thermally assisted “ Schottky” field emitters.
Range Benefit Ultra High Resolution 2. View and Download Hitachi SEM S- 4700 user manual online. Note: To log into the PC and PC- SEM software,. Hitachi s4800 sem manual.
Beam current; therefore, the operator must optimize the SEM for either a high signal image or a highly resolved image. Hitachi S- 4800 FE- SEM Standard Operating Procedures Feb,. Cond Lens 2 also must be selected, but is not adjustable. Ensure the SEM is in High- Mag Mode ( there should be no LM in the Mag display. The new SU8000 Series has excellent imaging performance throughout the range, and oﬀ ers a variety of stages, chambers and signal detection systems. If you are not included on a list of authorized SEM users then STOP and obtain access authorization prior to use.
Black 8/ 11/ 11 Applying the SEM high voltage WARNING: Operation of the microscope is authorized only after completion of user training. First, read and get familiar with the safety precautions described in the opening pages and General Safety Guidelines. SEM S- 4700 Laboratory Equipment pdf manual download.
Hitachi High- Tech has developed the SU8000 Series to fulfill tomorrow’ s market needs. Activate Chamber Camera using the Camera On/ Off button located below the chamber scope monitor. HITACHI UHR FE- SEM SU8000 Series. High Resolution FE- SEM has grown to be an indispensable tool to observe the ﬁ ne surface structure of materials in a wide range of nanotechnology ﬁ elds.